Industry Needs: Data, Cost Savings, Profit Maximization
Fraunhofer Institute for Electronic Nano Systems ENAS, Technology Campus 3, 09126 Chemnitz
Experience the future of production in our workshop on IIoT – smart sensing and actuation! Learn from experts how to develop and qualify smart sensors to enhance the efficiency of your production processes. The workshop provides insights into the fundamentals of sensor development, performance evaluation of edge devices, and the integration of intelligent systems in manufacturing environments. You will discover how to capture and utilize operational data through sensor monitoring. Additionally, the latest technologies for wireless connectivity will be presented, including fault detection and the use of AI for data analysis.
Take the opportunity to network with professionals and gain valuable inspiration for your projects. The workshop is aimed at engineers, developers, and anyone interested in the digital transformation of industry. Join us and actively shape the future of production!
- Registration link coming soon -
Language: German (slides in English)
| Time | Content | Speaker |
|---|---|---|
| 09:00 - 09:15 | Welcome | Alexander Weiß |
| Fundamentals of Sensor Development | ||
| 09:15 - 10:00 | Methodical Development and Qualification of Smart Sensors | Martin Lehmann |
| 10:00 - 10:45 | Introduction to Systematic Performance Evaluation of Edge Devices | André Schneider |
| 10:45 - 11:15 | Break | |
| Operational Data Acquisition using Sensors | ||
| 11:15 - 12:00 | Sensory Monitoring in Production and Plant Engineering I | Alexander Weiß |
| 12:00 - 12:45 | Sensory Monitoring in Production and Plant Engineering II | Volkhard Beyer |
| 12:45 - 13:45 | Break | |
| Wireless Connectivity and Data Processing as well as Evaluation | ||
| 13:45 - 14:30 | Wireless Connectivity for IoT - Integration, Testing, and Troubleshooting | Andreas Frotzscher |
| 14:30 - 15:15 | Production Monitoring: How to Gain and Effectively Use the Right Data? | Olaf Enge-Rosenblatt |
| 15:15 - 15:45 | Summary, Discussion, Feedback |
High Performance Center »Functional Integration in Micro- and Nanoelectronics«