300 mm Wafer Service

We provide blank wafer and structured wafer for further processing including advanced metrology.

Blank Wafer

300 mm Blank Wafer

Silicon based Layer

  • SiO2 (thermal or chemical formed oxide)
  • Organo silicate glass (SiCOH/ULK) [porous]
  • SiGe
  • Doped amorphous Si and poly Si (P, B)


  • PVD: Ta(N), Ti(N), Cu
  • CVD: Co
  • ECD: Co, Cu

ALD based Oxides and Nitrides

  • Al2O3
  • HfO2 (doped)
  • ZrO2
  • More materials upon request

Structured Wafer for CMOS (FEoL/BEoL)

300 mm Structured Wafer

Test Structures for various Processes at ≤ 28 nm Technology Node 

  • CMP | Plating | Cleaning
  • Thin films | STI

Test Structures for functional Layers

  • Memory applications
  • MIS/MIM structures

Custom Layout Implementation / E-Beam Lithography Nanopatterning

Test Structures for BEOL / Wafel Level Packaging (IZM-ASSID)

  • TSV Test Wafers (via middle, via last)
  • Si Interposer with Cu-TSV
  • Fine pitch flip Interconnects
  • Teships for chip-to-wafer / chip-to-chip / chip-to-substrate bonding

Structured Wafer for Wafel Level Packaging

300 mm Structured Wafer
  • TSV Test Wafers (via middle, via last)
  • Si Interposer with Cu-TSV
  • Fine pitch flip Interconnects
  • Testchips for chip-to-wafer / chip-to-chip / chip-to-substrate bonding

Wafer Thinning

  • Grinding and polishing of single and compound wafers
  • Stress relief etching, Chip-Side-Wall-Healing
  • TAIKO wafer processing


  • Mechanical Blade-Dicing, Laser-Grooving
  • Laser Stealth-Dicing, Wafer-Edge-Trimming; Circle-Cut


  • Die to Wafer /Interposer Assembly (Flip Chip soldering)
  • Wafer to Wafer temporary and permanent bonding
  • Thermo-compression, anodic Wafer Bonding, Hybrid Bonding

High-density and ultra fine Pitch Interconnect Formation

  • Galvanic deposition technology
  • Solder bumping: SnAg, In, InSn, AuSn, Sn
  • Pillar bumping: Cu, Au, Ni, porous nano-gold
  • Single-Chip-Bumping on Carrier wafers
  • Ultra-Fine-Pitch Bumping < 10µm

TSV Integration

  • Front- / Backside TSV
  • Cu-TSV liner, full-filled, FS Via-middle, BS Via –Last, Via -First


Test wafers are verified in our metrology system park for a fast realization of further qualification steps on site.

Picture of an EFTEM (Energy filtered transmission electron microscopy)
  • Layer thickness and uniformity 
  • (4-point probing, ellipsometry, XRR, high res. profi lometry)
  • Film morphology and structure 
  • (AFM [3D], XRD, surface inspection, SEM, TEM, porosimetry)
  • Chemical composition & contamination
  • Patterned defect inspection
  • Electrochemical monitoring of electrolyte solutions and additives 
  • (CVS, LP, EIS, etc.)
  • Electrical characterization of functional layers and layer stacks 
  • (Semi-automatic probing)